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Wire probe

Wire probe characteristics

Wire probe

The wire probe is a probe that does special plating and insulating coatings to ultra fine wires such as tungsten. It is a probe using vertical contact deflection of ultra fine tungsten wire, as contact force.

Wire probe list

Wire probe list ※The color part in the middle of the probe is an insulating coating using electrode position coating.
Type KT110-30 KT90-30 KT70-30 KT70-20 KT50-20 KT40-20 KT30-20 KT20-20
Min pitch 300μm 150μm 100μm 100μm 80μm 65μm 55μm 45μm
Contact force 20.0g 8.0g 3.0g 8.0g 2.0g 1.5g 0.8g 0.5g
Allowable current 1100mA 750mA 500mA 500mA 250mA 200mA 150mA 100mA
Individual resistance 200mΩ 450mΩ 620mΩ 430mΩ 680mΩ 900mΩ 2300mΩ 4820mΩ
Diameter Φ110μm Φ90μm Φ70μm Φ70μm Φ50μm Φ42μm Φ32μm Φ22μm
Standard stroke 250μm 250μm 250μm 250μm 200μm 150μm 100μm 100μm
Self inductance 36.0nH 37.2nH 38.7nH 24.2nH 25.5nH 26.4nH 27.0nH 28.8nH
Capacitance 0.41pF 0.21pF 0.15pF 0.10pF 0.12pF 0.13pF 0.14pF 0.13pF

Tip shape

Each size probe has three probe tip shapes like round, needle and flat. The optimum shape can be selected depend on the characteristics of the DUT and the testing purpose.

Fixture structure of wire probe

Fixture structure of wire probe

The fixture structure using wire probe is really simple.The universal part assembled by combining multiple plates made of resin or ceramics which made precise holes in testing position, and posts. Insert the wire probe into the hole on one side of the universal part so that the tip side contacts the DUT.On the back side of the probe, make an electrode part by a plate embedded with enameled wires and conductive blocks.We will ship after finishing the conection processing of electrode wiring, so you can connect to any tester or inspection equipment.

This structure which used contact deflection between the two plates is not only makes the structure itself simple but also makes a uniform contact force.With this wire probe test fixture, it is possible to generate the maximum force of the probe by just overdriving 50 μm.Because of these characteristics, The same force can be applied to all probes even if the surface of DUT is slightly distorted. Therefore, the same contact force will be applied, which reduce the scratches in the test.

This structure is very easy to maintain. Because of the universal part can be removed from the electrode part with a simple tool and the operator can replace the pins easily in clean room.

If you have any question,please feel free to ask.