When manufacturing an IC (semiconductor integrated circuit), the Test fixture called a probe card is used to electrically test the IC. This IC is formed on a silicon wafer in a wafer testing process. The wire probe is a needle shaped part built into this Test fixture, which acts like a connector that connects the electrode of the IC chip to the measuring instrument.
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What is probePROBE
It is a probe using a vertical contact deflection of ultra fine tungsten wire, as contact force.It is used for narrow pitch fixtures.
The double-side probe was developed instead of the conventional separateｄ type spring probe. It also corresponds to IC socket and probe card for TAB inspection, which reduces cost of PCB test fixture.
This type's probe and socket are separated. A spring is incorporated in the probe, and spring pressure is used for contact force. It is used for fixtures with relatively wide pitch.
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